Contact Us  |  Site Map  |  Home
Technos International - Semiconductor Metrology | X Ray Fluorescence | TREX | Monitoring Wafer Contamination | S-MAT | Thin Film Measurement
products applicationstechnologYcompanytradeshows/conferencessupport



Welcome to Technos International

Technos is a world leader in analytical x-ray metrology tools and solutions for the semiconductor industry. Technos Co, Ltd (http://www.technos.co.jp) is headquartered in Osaka, Japan, where all the instruments are designed, developed and manufactured. Technos Co Ltd and its subsidiaries are privately owned. The company was founded in 1987 by five engineers who used their visionary ideas to develop one of the first commercial wafer contamination monitoring systems: The TREX TXRF. Technos has since expanded its product lines, to include additional innovative x-ray analysis systems including the TVD 910, and S-MAT thin film metrology product line.


Technology Innovator

Pioneer and world leader in applying x-ray technology; Technos helps the semiconductor industry solve manufacturing challenges. With 20 years of technical experience, Technos has gained valuable expertise in analytical x-ray applications for the semiconductor industry via the strength of our world wide installed base, this experience is returned to our customers through aggressive product innovation and evolution to meet our customers needs.

Technos is your

" Partner in Semiconductor X-Ray Metrology offering Next Generation Solutions Today"


Semi.org   Sematech.org   ITRS   Technorays
Semi Sematech ITRS Technoray


  Featured Products  

S-MAT On-Product
Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

Technos On-Product X-ray Metrology
Semiconductor Metrology | X Ray Fluorescence | TREX | Monitoring Wafer Contamination | S-MAT | Thin Film Measurement

  Events  

Oct 7 - 9th 2008

Semicon Europa
Stuttgart Germany
Booth #2673


Semiconductor Metrology | X Ray Fluorescence | TREX | Monitoring Wafer Contamination | S-MAT | Thin Film Measurement
 
Technical Documentation
 
ProductsApplicationsTechnologyCompanyTradeshows/ConferencesSupportContact UsSite MapResources
web strategy byPatrick