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Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring
Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring
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Support - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

At Technos we understand our customers and the complexity of today's Advanced Semiconductor Manufacturing environment. We have designed our customer support around the specific needs and sensitivities of the semiconductor industry and employ industry knowledgeable service engineers dedicated to the products installed:

Proactive PM Schedule, Improves Mean Time To Failure - MTTF
Factory Trained and Experienced Service Engineers, Lowers Mean Time To Repair - MTTR
Optimal Service Engineer-to-Tool Ratio, for Quick Response Time
24/7 Telephone Support
Large Dedicated and Centrally Located Spares Inventories in the US and EU
Customized Service Contracts and Operator Training Programs
Advanced Applications Training and Support

Service Contracts
Two hour Phone Response 24 x 7 x 365
24 Hour On-Site Response 8 x 5 Coverage (optional 24 x 7)
Time and Materials
Customized Contracts to Meet Specific Customer Requirements

Training Programs (classes held throughout the year as required)
Factory Training
 
  • Applications
  • Maintenance
Operator Training
 
  • System Use
  • Consumables Maintenance
Applications Audits
 
  • System Utilization Analysis
  • New Applications Review/Training

For more information or to request service please call John Dorgan at 1-866-TECHN06 (1-866-832-4666) or e-mail customersupport@technos-intl.com
 

  Featured Products - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring  

S-MAT On-Product
Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

Technos On-Product X-Ray Metrology

Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

  Events - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring  

Oct 7 - 9th 2008

Semicon Europa
Stuttgart Germany
Booth #2673

Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring
Contamination Monitoring: TREX 610 Series | TREX 620 Series | TREX 630 Series | TREX 630i Series | Rapid Scan | TVD 910  
S-MAT On-Product | S-MAT PV XRF
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