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Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring
Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring
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Home : Products : Contamination Monitoring : TREX 610 TXRF Series

TREX 610 TXRF Series - Contamination Monitors | TREX | Secs Gem | TXRF | ICP MS | TVD | Rapid Scan | Metrology System | Wafer Surface Contaminants | X Ray Fluorescence Analyzer | ICPMS

Request More Info - Contamination Monitors | TREX | Secs Gem | TXRF | ICP MS | TVD | Rapid Scan | Metrology System | Wafer Surface Contaminants | X Ray Fluorescence Analyzer | ICPMS

The TREX 610 series is a high-performance contamination monitoring tool, that utilizes powerful sealed-tube x-ray sources for extended elemental range.

The sealed tube design offers low Cost of Ownership (CoO) and excellent detection limits for a broad elemental range. The TREX 610 features automated wafer handling and a patented alignment system, that enables mapping of surface and sub-surface contaminants and semi-quantitative analysis on the wafer backside.

Elemental Measurement range: Na to U
LLD range: E9 atoms/cm²
Wafers: 100, 125, 150, 200 and 400mm
Automatic Wafer handling
CE Compliant
X-Ray Sources: Mo-Sealed Tube, Ag-Sealed Tube, W-Sealed Tube and Cr-Sealed Tube.

TREX 610 TXRF Series
 

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S-MAT On-Product
Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

Technos On-Product X-Ray Metrology

Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring

  Events - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring  

March 23 - 25th 2009

Surface Preparation and Cleaning Conference
Austin , TX, USA

Technos International - Semiconductor Metrology, X-Ray Measurement Solutions, Semiconductor Industry Solutions, Wafer Contamination Monitoring
Contamination Monitoring: TREX 610 Series | TREX 620 Series | TREX 630 Series | TREX 630i Series | Rapid Scan | TVD 910  
S-MAT On-Product | S-MAT PV XRF
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